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Chadwin D. Young
Assistant Professor-Materials Science & Engineering, Department of
Contact Address   800 W. Campbell Rd., Richardson, TX 75080-3021     Office MailstopMail Box: RL10, NSERL, Room No.: 4.404 
Email Address  chadwin.young@utdallas.edu    Primary Phone Number 972-883-5770    Fax Number 972-883-5725    Media Contact
 Professional Preparation
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 DegreeMajorInstitutionYear
 Ph.D.Electrical EngineeringNorth Carolina State Univ.2004
 M.S.Electrical EngineeringNorth Carolina State Univ.1998
 B.S.Electrical EngineeringUniv. of Texas - Austin1996
Collapse Section Expand Section Research and Expertise
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Electrical Characterization and Reliability

Novel Characterization Development

  • Involved the measurement and evaluation of transistors and capacitors of experimental gate stacks and device structures (alternative gate electrodes, ultra-thin oxides, oxynitrides, and high-dielectric constant insulators, non-planar devices, and high mobility substrates)
  • Engaged in the electrical characterization and reliability of projected material and device architectures below the 22 nm node as defined by the International Technology Roadmap for Semiconductors (ITRS) as well as other future device architectures, which can call for high-k dielectrics and high mobility and/or flexible substrate material systems

Research Interests

  • Electrical Characterization Methodologies
  • Reliability Characterization Methodologies
  • Solid State Device Physics
  • Electrical properties of materials
  • MOS modeling (quantum effects, etc.)
  • Nanotechnology
  • Flexible Electronics 
  • Future Energy Needs (Renewable, low power operation, etc.)
Collapse Section Expand Section Publications
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 1  2  
  YearPublication  Type
2012
K.-W. Ang, K. Majumdar, K. Matthews, C. D. Young, C. Kenney, C. Hobbs, P. D. Kirsch, R. Jammy, R. D. Clark, S. Consiglio, K. Tapily, Y. Trickett, G. Nakamura, C. S. Wajda, G. J. Leusink, M. Rodgers, and S. C. Gausepohl, "Effective Schottky Barrier Height modulation using dielectric dipoles for source/drain specific contact resistivity improvement," in IEEE Int’l Electron Devices Meeting (IEDM), pp. 18.6.1 - 18.6.4, 2012.
Peer reviewed
2012
C. D. Young, K. Akarvardar, M. O. Baykan, K. Matthews, I. Ok, T. Ngai, K.-W. Ang, J. Pater, C. E. Smith, M. M. Hussain, P. Majhi, and C. Hobbs, “(110) and (100) Sidewall Oriented MugFETs:  A Performance and Reliability Investigation,” Solid-State Electronics, 78, pp. 2-10, 2012.
Peer reviewed
2012
C. D. Young, G. Bersuker, M. Jo, K. Matthews, J. Huang, S. Deora, K. W. Ang, T. Ngai, C. Hobbs, P. D. Kirsch, A. Padovani, and L. Larcher, "New insights into SILC-based life time extraction," in IEEE International Reliability Physics Symposium, 2012, pp. 5D.3.1-5D.3.5.
Peer reviewed
2011
C. D. Young, M. O. Baykan, A. Agrawal, H. Madan, K. Akarvardar, C. Hobbs, I. Ok, W. Taylor, C. E. Smith, M. M. Hussain, T. Nishida, S. Thompson, P. Majhi, P. Kirsch, S. Datta, and R. Jammy, "Critical discussion on (100) and (110) orientation dependent transport: nMOS planar and FinFET," in Symposium on VLSI Technology (VLSIT), pp. 18-19, 2011.
Peer reviewed
2011
C. D. Young, D. Veksler, S. Rumyantsev, J. Huang, H. Park, W. Taylor, M. Shur, and G. Bersuker, "Evaluation of the N- and La-induced defects in the high-κ gate stack using low frequency noise characterization," Microelectronic Engineering, vol. 88, pp. 1255-1258, 2011.
Peer reviewed
Collapse Section Expand Section Appointments
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DurationRankDepartment / SchoolCollege / OfficeUniversity / Company
2012-presentAsst. ProfessorMaterials Science and Engineering/Electrical Engineering UT - Dallas
2010-2012Senior Member of Technical StaffFront End Processes SEMATECH
2008-2010Member of Technical StaffFront End Processes SEMATECH
2006-2008Project EngineerFront End Processes SEMATECH
2004-2006Post DocFront End Processes SEMATECH
2001-2004PhD InternFront End Processes SEMATECH
1990-2000InternNumerous Internships IBM, Motorola, Four Dimensions, Los Alamos Nat. Lab., etc.
 Synergistic Activities
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Professional Memberships
  • Institute of Electrical and Electronics Engineers (IEEE)
  • American Vacuum Society (AVS)
  • Electrochemical Society (ECS)

Professional Service
  • IEEE Semiconductor Interface Specialists Conference – Executive Committee (2011-2013)
  • IEEE International Reliability Physics Symposium – Technical Program Committee (2008-2013)
  • IEEE International Electron Devices Meeting – Technical Program Committee (2011-2012)
  • IEEE Semiconductor Interface Specialists Conference – Technical Program Committee (2008-11)
  • IEEE International Integrated Reliability Workshop – Executive Committee (2005-2010)
  • IEEE International Integrated Reliability Workshop – Technical Program Committee (2005-2012)
  • Workshop on Dielectrics in Microelectronics – Steering Committee Member (2010-present)

Reviewer Activities
  • IEEE Electron Device Letters
  • IEEE Transactions on Electron Devices
  • IEEE Transactions on Device and Materials Reliability
  • Applied Physics Letters
  • Microelectronic Engineering
  • Microelectronic Reliability
  • Solid-State Electronics

Editorships
  • Guest Editor for IEEE Trans. Device and Materials ReliabilityIIRW Special Issues 2006-07 and 2008-09

Collaborations

List of External Collaborators During Past Four Years:

S. Datta (Penn State), J. DelAlamo (MIT), P. Majhi (Intel), P. Lenahan (Penn State), D.S. Ang (NTU), B.K. Knowlton (Boise State), R.Jammy (SEMATECH),  P.Kirsch (SEMATECH), G. Bersuker (SEMATECH), Jason Ryan (NIST), Jason Campbell (NIST), L. Larcher (U. Modena), A. Padova (U. Modena), R. Choi (Inha Univ., Korea), B.H. Lee (GIST, Korea), S. Thompson (U. Florida – Gainesville), A. Neugroschel (U. Florida – Gainesville)

Ph.D. Thesis Supervisor:

Prof. Veena Misra, North Carolina State University

Postdoctoral Supervisor:

Gennadi Bersuker, SEMATECH

List of Students Supervised:

Provided significant guidance and training to many students interns (2-yr Associate Degree up to Ph.D.) on experimental, theory, and lab practices of electrical characterization and reliability on novel materials and device structures while at SEMATECH.  


Selected Fellowships, Honors, and Awards
  • (2007) Senior Member of the IEEE
  • (2004) Corporate Excellence Award – SEMATECH’s highest technical honor for pulse-based electrical characterization techniques for the evaluation of high-k gate dielectrics
  • (1998-2000) Engineering Research Center Fellowship – Center for Advanced Electronic Materials Processes, NC State University
  • (1996-98) Graduate Engineering Education Fellowship – National Science Foundation
  • (1996) National Member of the Year – One national award from the National Society of Black Engineers is chosen annually from the entire student membership

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